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FTM-Lite Film Thickness Gauge

Our new FTM-Lite film thickness gauges use the white-light interference phenomenon for film thickness determination. Basics on the measurement method is described at Applications. The FTM-Lite instruments are designed especially for manually performed but even though high-precise measurements in the lab.

  • Non-contact and non-destructive measurement

  • Non-radiation optical method using white light

  • Simultaneous determination of double-layers possible

  • Maintenance-free and handy desktop gauge for USB 2.0

  • Thickness range FTM-Lite VIS: ~ 1 to   25 microns ( 0.04 to 1 mil )

  • Thickness range FTM-Lite NIR: ~ 2 to 100 microns ( 0.08 to 4 mil )

  • Comfortable and easy-to-use software FTM-ProVis Lite


FTM-Lite VIS film thickness gauge
FTM-Lite VIS  ~ 1-25 micrometer
 

FTM-Lite NIR film thickness gauge
FTM-Lite NIR  ~ 2-100 micrometer
 



The FTM-Lite film thickness gauges consists of a TranSpec Lite spectrometer (at bottom in the pictures), the HSL Lite halogen light source (at top in the pictures), a bifurcated fiber optics cable with probe holder and our FTM-ProVis Lite software package.

For developing your own film thickness applications using our FTM-Lite film thickness gauges, we provide our powerful and very easy-to-use FTM-Lite++ programming library as DLL using standard-C calls.